user@user-laptop:~$ sudo smartctl -d ata -a /dev/sda1 | grep Load_Cycle
193 Load_Cycle_Count 0x0032 097 097 000 Old_age Always - 38086
user@user-laptop:~$ sudo smartctl -d ata -a /dev/sda1
smartctl version 5.38 [x86_64-unknown-linux-gnu] Copyright © 2002-8 Bruce Allen
Home page is
http://smartmontools.sourceforge.net/=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK1032GSX
Serial Number: 46AI2256S
Firmware Version: AS021G
User Capacity: 100.030.242.816 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 6
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Feb 7 23:17:51 2010 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 384) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 76) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1987
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1433
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 086 086 000 Old_age Always - 5661
10 Spin_Retry_Count 0x0033 128 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1396
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 160
193 Load_Cycle_Count 0x0032 097 097 000 Old_age Always - 38086
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 44 (Lifetime Min/Max 9/50)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 6
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 8371
222 Loaded_Hours 0x0032 087 087 000 Old_age Always - 5227
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 321
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 59 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 59 occurred at disk power-on lifetime: 2932 hours (122 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 03 60 e0 Error: UNC at LBA = 0x0060032c = 6292268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 01 2c 03 60 e0 00 00:51:20.561 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:20.544 READ DMA
40 00 01 2b 03 60 e0 00 00:51:20.528 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:20.511 READ DMA
40 00 02 2d 03 60 e0 00 00:51:20.494 READ VERIFY SECTOR(S)
Error 58 occurred at disk power-on lifetime: 2932 hours (122 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 03 60 e0 Error: UNC at LBA = 0x0060032c = 6292268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 02 2b 03 60 e0 00 00:51:13.716 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:13.708 READ DMA
40 00 04 2b 03 60 e0 00 00:51:06.950 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:06.933 READ DMA
40 00 04 27 03 60 e0 00 00:51:06.916 READ VERIFY SECTOR(S)
Error 57 occurred at disk power-on lifetime: 2932 hours (122 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 03 60 e0 Error: UNC at LBA = 0x0060032c = 6292268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 04 2b 03 60 e0 00 00:51:06.950 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:06.933 READ DMA
40 00 04 27 03 60 e0 00 00:51:06.916 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:06.908 READ DMA
40 00 08 27 03 60 e0 00 00:51:00.166 READ VERIFY SECTOR(S)
Error 56 occurred at disk power-on lifetime: 2932 hours (122 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 03 60 e0 Error: UNC at LBA = 0x0060032c = 6292268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 08 27 03 60 e0 00 00:51:00.166 READ VERIFY SECTOR(S)
40 00 08 1f 03 60 e0 00 00:51:00.149 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:00.133 READ DMA
40 00 10 2f 03 60 e0 00 00:51:00.116 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:51:00.107 READ DMA
Error 55 occurred at disk power-on lifetime: 2932 hours (122 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 03 60 e0 Error: UNC at LBA = 0x0060032c = 6292268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 10 1f 03 60 e0 00 00:50:53.349 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:50:53.341 READ DMA
40 00 20 1f 03 60 e0 00 00:50:46.588 READ VERIFY SECTOR(S)
40 00 20 ff 02 60 e0 00 00:50:46.571 READ VERIFY SECTOR(S)
c8 00 01 00 00 00 e0 00 00:50:46.563 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.