sudo smartctl --all /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.16.0-38-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke,
www.smartmontools.org=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JG40006PGE9XHC
LU WWN Device Id: 5 000cca 6acc60e0f
Firmware Version: JB0OA3B0
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Nov 8 04:05:54 2015 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 193) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 097 097 062 Pre-fail Always - 131077
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 180 180 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1458
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 083 083 000 Old_age Always - 7872
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1456
191 G-Sense_Error_Rate 0x000a 098 098 000 Old_age Always - 131075
192 Power-Off_Retract_Count 0x0032 094 094 000 Old_age Always - 1248
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 3950
194 Temperature_Celsius 0x0002 171 171 000 Old_age Always - 35 (Min/Max 17/45)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 90
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 395
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 668 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 668 occurred at disk power-on lifetime: 7482 hours (311 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 b8 bf db 0c Error: UNC at LBA = 0x0cdbbfb8 = 215728056
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 80 b8 bf db 40 00 00:02:34.837 READ FPDMA QUEUED
60 00 78 e8 bf db 40 00 00:02:34.837 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 00 00:02:34.837 SET FEATURES [Enable SATA feature]
27 00 00 00 00 00 e0 00 00:02:34.836 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 00 00:02:34.834 IDENTIFY DEVICE
Error 667 occurred at disk power-on lifetime: 7482 hours (311 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 b8 bf db 0c Error: UNC at LBA = 0x0cdbbfb8 = 215728056
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 70 e8 bf db 40 00 00:02:30.430 READ FPDMA QUEUED
60 00 68 e8 be db 40 00 00:02:30.430 READ FPDMA QUEUED
60 00 60 e8 bd db 40 00 00:02:30.345 READ FPDMA QUEUED
60 00 58 e8 bc db 40 00 00:02:30.342 READ FPDMA QUEUED
60 00 50 e8 bb db 40 00 00:02:30.340 READ FPDMA QUEUED
Error 666 occurred at disk power-on lifetime: 7473 hours (311 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 28 38 bd 1e 00 Error: ICRC, ABRT 40 sectors at LBA = 0x001ebd38 = 2014520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 a8 b8 bc 1e e0 08 00:08:07.312 WRITE DMA EXT
25 00 08 60 c7 9e e0 08 00:08:07.293 READ DMA EXT
25 00 20 80 af 83 e0 08 00:08:07.280 READ DMA EXT
25 00 08 b8 bb 5b e0 08 00:08:07.261 READ DMA EXT
25 00 08 30 d9 db e0 08 00:08:07.178 READ DMA EXT
Error 665 occurred at disk power-on lifetime: 7473 hours (311 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 38 90 b8 1e 00 Error: ICRC, ABRT 56 sectors at LBA = 0x001eb890 = 2013328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 88 40 b8 1e e0 08 00:07:49.587 WRITE DMA EXT
25 00 08 c0 d9 5b e0 08 00:07:49.571 READ DMA EXT
25 00 38 d8 bc a4 e0 08 00:07:49.570 READ DMA EXT
25 00 88 88 99 e4 e0 08 00:07:49.556 READ DMA EXT
25 00 90 48 ab 80 e0 08 00:07:49.541 READ DMA EXT
Error 664 occurred at disk power-on lifetime: 7473 hours (311 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 48 00 ca 1e 00 Error: ICRC, ABRT 72 sectors at LBA = 0x001eca00 = 2017792
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 d8 70 c9 1e e0 08 00:04:36.172 WRITE DMA EXT
25 00 e8 a0 da 37 e0 08 00:04:36.153 READ DMA EXT
25 00 38 98 16 70 e0 08 00:04:36.153 READ DMA EXT
25 00 08 f8 80 7a e0 08 00:04:36.138 READ DMA EXT
35 00 08 20 19 6c e0 08 00:04:36.127 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.